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◆ 液晶模組老化測試系統：
Batch Type Oven
Cart Type Aging System
Drawer Type Aging System
Tunnel Type Aging System
TFT LCM In-Line System Design
◆ 液晶模組訊號系統：
Pattern Generator (LVDS, TTL)
Signal Distributor (LVDS, TTL, NTSC)
LVDS/TMDS/TTL Signal Conversion Card
1”~2.5” TFT/OLED Module Measurement/Signal Generator
3”~4” LCM Aging System (TTL/CCIR)
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 Cart Type Aging System -- Type II |
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| Capacity：32 pc 17” LCM / 16 pc 20” LCM |
| 1 PG/Cart；Distribute to 32 LVDS Output |
| Signal Interface：LVDS |
| VDD：3.3/5/12V @3A |
| IDD OCP：Selectable 0.5~3.0A，step 0.2A |
| Resolution：VGA~WUXGA、User Define |
| Models Num.：12 |
| Patterns Num.：32 |
| OP Mode：Auto/Manual |
| VBL：12/24V @6A |
| Low Cost、Easy to Use |
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 Draw Type Aging Chamber |
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| Capacity：240 pc 17” LCM |
| Signal Interface：LVDS |
| VDD：3.3/5/12V/CH4 (user define) @3A |
| VBL：12/24/Adj. V @5A |
| IDD OCP：Selectable 0.5~3.0A，step 0.1A |
| Resolution：VGA~WUXGA、User Define |
| Defect Inspection Cursor |
| Pulse-Power Test Function |
| Models：24 |
| Patterns：32 |
| OP Mode：Auto/Manual |
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 Batch Type Oven |
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| Capacity：80 LCM(15”) ~ 8 LCM(57”) |
| 5 PG Card/Oven；able to light on 5 models at the same time |
| VDD：3.3/5/12V/CH4 (user define) @3A |
| VBL：12/24V @10A max. |
| IDD OCP：Selectable 0.5~3.0A，step 0.2A |
| Resolution：VGA~WUXGA、User Define |
| Defect Inspection Cursor |
| Pulse-Power Test Function |
| Models：24 |
| Patterns：32 |
| OP Mode：Auto/Manual |
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 Tunnel Type Aging System |
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| Capacity：180 LCM(37”) ~ 360 LCM(23”) |
| 15 Cart/Chamber |
| VDD：3.3/5/12V @3A |
| VBL：VBL：12/24V @10A max. |
| IDD OCP：Selectable 0.5~3.0A，step 0.1A |
| IBL OCP：Selectable 0.5~10.0A，step 0.2A |
| Resolution：VGA~WUXGA、User Define |
| Defect Inspection Cursor |
| Pulse-Power Test Function |
| Models：24 |
| Patterns：32 |
| CIM system |
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 KX-405 Pattern Generator |
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| Resolution：VGA ~WUXGA、User Define |
| Output：LVDS / TMDS |
| Dot Clock：100MHz Max，100KHz step |
| VDD：Programmable 3.0~18V @ 3A step 0.1V |
| IDD OCP：Selectable 0.5~3.0A，step 0.1A |
| Models：24 |
| Patterns：32 |
| Gray Scale Scrolling Pattern |
| Defect Allocation Cursor |
| VBL：Internal 12V @5A / External CH2 |
| VFL：0~5V Inverter Brightness Dimming |
| EDID Read/Edit/Write Function |
| Remote Controller |
| PC Interface：RS-232 |
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 OLBI |
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| Size：14” ~ 32” |
| View Angle：Adjustable 60。~ 80。 |
| Adjustable Brightness ：7000 nits max. |
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 1.8”~12” LCM Aging System |
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| Signal Source：DVD Player |
| Interface：NTSC |
| Capacity：8 LCM/Tray |
| VCC：12V |
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 Small Size TFT LCM Tester |
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| Interface：TTL |
| Data width：24 bit |
| VCC：2.5~5.0 Adjustable |
| VBL：1.2~5V Adjustable |
| ICC、IBL Measurement |
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