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 OLED Cell Aging |
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| 一裂片後的OLED Cell, 在還沒Bond Driver IC之前, 將所有正極短路, 所有負極亦短路(以PM型為例), 而後在該二端點上加上正及負的電壓做測試 |
| 該交流測試電壓的大小, 頻率, 及週波數皆為Programmable(可在主控PC上設定), 在一次的交流測試後, 緊接著為量測段, 使用者先設定反偏電壓, HA570會對每一片面板量測其反偏逆電流並記錄, 解析精度至10nA. |
| 無論順向或逆向, HA570均提供限流保護, 可使某些先期不穩定的產品不至於斷電而有可能在持續的交流測試中復元. |
| OLED Cell是置於治具—電木Tray盤上, 一個Tray可置放30pc Cells, 一爐共可容納 : 24 Tray x 30 Cell = 720 Cell/爐. | |
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 Aging Process |
| Item |
Parameter |
Remark |
Total cycle
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Programmable 1~100
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| Tt |
1~250 min., 1 min. step
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Fwd Voltage |
| Tm |
60 sec. |
Measurement cycle time |
| Vft |
0~+20V, 0.1V step
|
Set for each cycle/each tray |
| Vrt |
0~-20V, 0.1V step |
Set for each cycle/each tray |
| Vrm |
0~-20V, 0.1V step |
Reverse voltage of Tm, Set for each cycle |
| f |
1~100Hz, 1 Hz step |
1/T, Frequency of Tt |
| Duty cycle |
5%~100%, 1% step |
Tf/T, rising time/falling time < 10uS |
| If |
200mA max. |
Output current | |
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 Measurement |
| Item |
Parameter |
Remark |
| IF |
0.1mA~200mA, 0.1mA step
|
Fwd current |
| Ir |
Accuracy：
1. 10nA~1uA：10nA
2. 1uA~100uA：5% |
Static-state Leakage Current | |
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 Current Limit |
| Item |
Parameter |
Remark |
If current limit
|
200mA |
Set for each cell |
| IR current limit |
200mA |
Set for each cell | | |
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